High Speed Semicon Test Handlers

● Up to 50,ooo UPH,depending on device and process.
● Up to 6 Test Sites.
● Bowl Feeder Input.
● Tape and Reel Output with Auto-Reject and Replacement.
● Vision Inspection with Top inspection,5S,6 sides and In-pocket.
● Unique force limitation control for thin and fragile handling at high speed.
● Wide applicable device range 1 x 1 mm to 8 x 8 mm.
● Automatic EQC material collection.
● Probe auto-cleaning module.
● Booster Semi-SW Data Intelligence System.

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